SoyBase SoyBase transitions to NEW site on 10/1/2024
Integrating Genetics and Genomics to Advance Soybean Research



Pod maturity 32-3
Parent 1:Taekwangkong
Parent 2:SS2-2
Num loci tested:124
Interval length:6.9
Interval LOD score:13.9
Trait name:R8 Full Maturity

SourceAccession Number
Plant Trait OntologyTO:0002661
Plant OntologyPO:0009010
Gene OntologyGO:0010154

     
Pod maturity 32-1
Pod maturity 32-2

Sun et al. 2013QTLs for resistance to Phomopsis seed decay are associated with days to maturity in soybean (Glycine max) 
Theor. Appl. Genet. 2013, 126(8):2029-2038

     
MapLGStartEnd
GmComposite2003_O O112.60119.50See this QTL region in Sequence Browser

Sat_038Parent_1156 days to maturity
Sat_038Parent_2147 days to maturity
Sat_038Phenotypic_R218.4
Sat_038Favorable_allele_sourceSS2-2
Sat_038Additive_effect-9.9

F8 RIL

ParentTrait
TaekwangkongLate maturity
SS2-2Early maturity

Phomopsis seed decay

Sat_038
Satt243

MapMaker/EXP 3.0b
WinQTL Cartographer 2.5
CIM

Publication measured phomopsis seed decay by Phomopsis longicolla, which was defined as the percentage of mature seeds collected 10 days after maturing which showed infection after 4 or 7 days of incubation on Acidified Potato-Dextrose Agar (APDA). See publication for additional details.
Parent_1 was Taekwangkong, Parent_2 was SS2-2






Funded by the USDA-ARS. Developed by the USDA-ARS SoyBase and Legume Clade Database group at the Iowa State University, Ames, IA
 
USDA Logo
Iowa State University Logo