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Phomopsis seed decay 3-1
Parent 1:Taekwangkong
Parent 2:SS2-2
Num loci tested:124
Interval length:3.81
Interval LOD score:24.7
Trait name:Reaction to Diaporthe longicolla Infection

Controlled vocabulary terms associated with the QTL
SourceAccession Number
Plant Trait OntologyTO:0000439

     
Other related QTL's
Phomopsis seed decay 3-2

References for the QTL
Sun et al. 2013QTLs for resistance to Phomopsis seed decay are associated with days to maturity in soybean (Glycine max) 
Theor. Appl. Genet. 2013, 126(8):2029-2038

     
Maps containing Phomopsis seed decay 3-1
MapLGStartEnd
GmComposite2003_C2 C2113.95117.76See this QTL region in Sequence Browser

Loci positively associated with the QTL
Satt460Parent_19.3% infected
Satt460Parent_288% infected
Satt460Phenotypic_R246.3
Satt460Favorable_allele_sourceTaekwangkong
Satt460Additive_effect-0.2

Population types used in identification of the QTL
F8 RIL

Parent trait values associated with the QTL
ParentTrait
TaekwangkongPhomopsis resistant
SS2-2Phomopsis susceptible

Other QTLs studied
Days to maturity

Loci associated with the QTL
Satt100
Satt460

Methods used to identify the QTL
MapMaker/EXP 3.0b
WinQTL Cartographer 2.5
CIM

Comments about the QTL
Publication measured phomopsis seed decay by Phomopsis longicolla, which was defined as the percentage of mature seeds collected 10 days after maturing which showed infection after 4 or 7 days of incubation on Acidified Potato-Dextrose Agar (APDA). See publication for additional details.
Parent_1 was Taekwangkong, Parent_2 was SS2-2
Phomopsis seed decay (PSD) is caused by members of the Diaporthe/Phomopsis genus.






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