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Seed yield 4-1
Parent 1:Essex
Parent 2:Forrest
Num loci tested:70
Percent Variation Explained:27
Trait name:Seed yield

SourceAccession Number
Plant Trait OntologyTO:0000396

     
Sd yld 4-1

Hnetkovsky et al. 1996Genetic mapping of loci underlying field resistance to soybean sudden death syndrome (SDS). 
Crop Sci. 1996, 36(2):393-400

     
MapLGStartEnd
GmComposite2003_N N135.00137.00See this QTL region in Sequence Browser

OC01_650Parent_12547 kg/ha for alleles from Essex
OC01_650Parent_23050 kg/ha for alleles from Forrest
OC01_650Phenotypic_R20.310000
OC01_650P_value0.000800

F5:7 RIL
F5:11 RIL

ParentTrait
EssexLower yield
ForrestHigher yield

Sudden death syndrome resistance

OC01_650

ANOVA

As measured by Mapmaker/QTL, chromosomal segment not significantly associated with yield
Study done by analysis of variance at locus; for purposes of display this was converted to an interval around that locus.






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