| Title: | Loci underlying resistance to manganese toxicity mapped in a soybean recombinant inbred line population of 'Essex' x 'Forrest' |
| Authors: | Kassem, My.A., Meksem, K., Kang, C.H., Njiti, V.N., Kilo, V., Wood, A.J., Lightfoot, David A. |
| Source: | Plant Soil 2004, 260(1-2):197-204 |
| Abstract: | Resistance to manganese toxicity is associated with some soyabean (Glycine max) cultivars grown on acidic soils or in hydroponics. Previously random amplified polymorphic DNA (RAPD) markers had seemed to identify 4 quantitative trait loci (QTL), regions that might underlie resistance to manganese toxicity in a recombinant inbred line (RIL) population derived from 'Essex' x 'Forrest'. Our objective was to identify microsatellite markers linked to these, or additional, QTL for resistance to manganese toxicity in a separate assay. Two hundred and forty microsatellite markers and 100 RILs were used to construct a map. The response of five plants per genotype to manganese was measured by leaf chlorosis (scored from 0-5) and root necrosis (scored from 0-5) from 7-28 days after treatment with 125 micro M of manganese in hydroponics. The experiment was repeated. ANOVA and MapMaker/QTL were used to identify regions underlying the responses. Three genomic regions on different linkage groups were found to contain QTL for resistance to necrosis during manganese toxicity. The regions located on linkage groups C2 (BARC_Satt291), I (BARC_Satt239) and G (OP_OEO2) were each significantly associated (P<0.005, R2=20%) with root necrosis at 7 days after treatment. The regions all derived the beneficial allele from Essex. One of the previously identified RAPD associated root necrosis QTL was identified in this new study. However, no QTL for leaf chlorosis were detected (P<0.005) and none of the RAPD identified leaf chlorosis QTL could be identified. We conclude that root and leaf resistance to manganese toxicity are environmentally sensitive quantitative traits determined by separate loci of different number and magnitude of effect. |