| Title: | Mapping of new quantitative trait loci for sudden death syndrome and soybean cyst nematode resistance in two soybean populations |
| Authors: | Swaminathan, S., Abeysekara, N., Knight, J., Liu, M., Dong, J., Hudson, M., Bhattacharyya, M., Cianzio, S. |
| Source: | Theor Appl Genet 2018, 131:1047-1062 |
| Abstract: | Soybean cultivars, susceptible to the fungus Fusarium virguliforme, which causes sudden death syndrome (SDS), and to the soybean cyst nematode (SCN) (Heterodera glycines), suffer yield losses valued over a billion dollars annually. Both pathogens may occur in the same production fields. Planting of cultivars genetically resistant to both pathogens is considered one of the most effective means to control the two pathogens. The objective of the study was to map quantitative trait loci (QTL) underlying SDS and SCN resistances. Two recombinant inbred line (RIL) populations were developed by crossing ÔA95-684043Õ, a high-yielding maturity group (MG) II line resistant to SCN, with ÔLS94-3207Õ and ÔLS98-0582Õ of MG IV, resistant to both F. virguliforme and SCN. Two hundred F7 derived recombinant inbred lines from each population AX19286 (A95-684043 _ LS94-3207) and AX19287 (A95-684043 _ LS98-0582) were screened for resistance to each pathogen under greenhouse conditions. Five hundred and eighty and 371 SNP markers were used for mapping resistance QTL in each population. In AX19286, one novel SCN resistance QTL was mapped to chromosome 8. In AX19287, one novel SDS resistance QTL was mapped to chromosome 17 and one novel SCN resistance QTL was mapped to chromosome 11. Previously identified additional SDS and SCN resistance QTL were also detected in the study. Lines possessing superior resistance to both pathogens were also identified and could be used as germplasm sources for breeding SDS and SCN-resistant soybean cultivars. |